Nanometrics NanoSpec 3000 from Tech-Semi, Inc.
NANOMETRICS NanoSpec 3000 Film thickness measurement system, 3"-6"
Solid stage linear diode array detector
(15) Standard film types
Measurement time: 0.25 s to 4 s / site
Data management:
Statistical data analysis
Data export (ASCII)
Hardware configuration:
Optics: 10x
Spot size: 25 μm
Computer: 333 MHz PC With 3.2 G hard dive, 64 RAM
Performance:
Film: (3) Layers
Film thickness range: 250 A to 35 µm
Wavelength range: 480-800 nm
Reproducibility: <2 A
Electrical power:
Lamphouse: 50 W
117±5% VAC, 50/60 Hz, 5 A
230 V, 50/60 Hz, 2.5 A
2001 vintage.
